Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4 Ga old zircon.
作者： Gelsomina De Stasio , Bradley H. Frazer , Benjamin Gilbert , Katherine L. Richter , John W. Valley
DOI: 10.1016/S0304-3991(03)00088-3
关键词: Silicate 、 Analytical chemistry 、 XANES 、 Coating 、 Quartz 、 Chemical species 、 Cubic zirconia 、 Inclusion (mineral) 、 Zircon 、 Chemistry 、 Mineralogy
摘要: Abstract We present a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals can spatially resolve species resolution presently reaching 35 nm. tested differential by analyzing 4.4 billion-year-old zircon (ZrSiO 4 ) containing silicate inclusions. observed quartz (SiO 2 inclusions smaller than 1 μm in size that only be analyzed non-destructively synchrotron spectromicroscopies. With removal charging we greatly extend range X-PEEM.
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