作者: S. Mahajan , J.G. Wen , W. Ito , C.H. Cho , T. Takenaka
DOI: 10.1016/0921-4534(94)90734-X
关键词: Sheet resistance 、 Thin film 、 Superconductivity 、 Crystallography 、 Deposition (law) 、 Microstructure 、 Materials science 、 Layer (electronics) 、 Surface conductivity 、 Crystallinity
摘要: Abstract The crystalline and superconducting properties of sputtered a -axis oriented thin films Y 1 Ba 2 Cu 3 O 7− x on SrTiO (100) MgO substrates are compared using X-ray diffraction (XRD), high-resolution electron microscopy (HREM), atomic force microscopy, critical current ( J c ) surface resistance R s measurements. A two step self-template method was used for deposition, HREM measurements revealed that the bulk film beyond template pure also lattice-mismatched MgO. However, nature layer completely different crystallinity found to be dependent template. indicated owing its poor crystallinity, were dominated by weak links in contrast well-coupled grains .