An INL Yield Model of the Digital-to-Analog Converter
作者： Henry A. Park , Chih-Kong Ken Yang
DOI: 10.1109/TCSI.2012.2215114
关键词: Current distribution 、 Mathematics 、 Integral nonlinearity 、 Digital-to-analog converter 、 Source element 、 Segmentation 、 Yield (engineering) 、 Control theory 、 CMOS
摘要: The integral nonlinearity (INL) yield of any arbitrarily segmented digital-to-analog converter (DAC) has not been accurately modeled and requires long simulation time. This paper proposes an intuitive formulation the INL that leads to a simple accurate relation between variation unit source element DAC with only few fitting parameters. These parameters can be determined for varying number bits segmentation. A table is provided directly applied determine without additional simulation. validity model demonstrated measured current distributions from current-steering fabricated in 90-nm CMOS technology.
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