Symmetric Near-Field Probe Design and Comparison to Asymmetric Probes
作者： Jeffrey Doughty
DOI: 10.15760/ETD.390
关键词: Scanning probe microscopy 、 Scanning ion-conductance microscopy 、 Scanning confocal electron microscopy 、 Near and far field 、 Vibrational analysis with scanning probe microscopy 、 Near-field scanning optical microscope 、 Optics 、 Scanning capacitance microscopy 、 Materials science
摘要:
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