Tip sharpening by normal and reverse electrochemical etching

摘要: This article deals with the characteristics and formation by electrochemical etching under ac voltage of very sharp metal tips usable in several applications particular scanning probe microscopy [scanning tunneling (STM) atomic force microscopy]. An exhaustive survey other existing mechanical physicochemical procedures for producing is also included background comparison. Because tip sharpness central to or near‐atomic resolution attainable STM, yet appears be so far incompletely studied documented literature, it argued that high‐resolution evidence required proper characterization as a prerequisite toward adequate performance nanometer range. Although atomic‐resolution imaging two‐dimensional (flat) surfaces STM has been possible ill defined large apex radii, comparable on three‐dimensional (rough) requires use sleek shanks radii smaller th...