A zero-cost approach to detect recycled SoC chips using embedded SRAM

作者: Zimu Guo , Md. Tauhidur Rahman , Mark M. Tehranipoor , Domenic Forte

DOI: 10.1109/HST.2016.7495581

关键词: Static random-access memorySupply chainEmbedded systemIntegrated circuitLogic gateEngineeringReliability (computer networking)Field-programmable gate arrayElectronicsRejection rate

摘要: … We identify SRAM PUF cells that are very stable over time (eg… SRAM PUF, we will exploit the partially skewed cells (sensitive to aging) to detect recycled IC. Note that while BTI in SRAM …

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