作者: Zimu Guo , Md. Tauhidur Rahman , Mark M. Tehranipoor , Domenic Forte
关键词: Static random-access memory 、 Supply chain 、 Embedded system 、 Integrated circuit 、 Logic gate 、 Engineering 、 Reliability (computer networking) 、 Field-programmable gate array 、 Electronics 、 Rejection rate
摘要: … We identify SRAM PUF cells that are very stable over time (eg… SRAM PUF, we will exploit the partially skewed cells (sensitive to aging) to detect recycled IC. Note that while BTI in SRAM …