Recycled IC Detection Based on Statistical Methods
作者： Ke Huang , Yu Liu , Nenad Korolija , John M. Carulli , Yiorgos Makris
DOI: 10.1109/TCAD.2015.2409267
关键词:
摘要: We introduce two statistical methods for identifying recycled integrated circuits (ICs) through the use of one-class classifiers and degradation curve sensitivity analysis. Both rely on statistically learning parametric behavior known new devices using it as a reference point to determine whether device under authentication has previously been used. The proposed are evaluated actual measurements simulation data from digital analog devices, with experimental results confirming their effectiveness in distinguishing between aged ICs superiority over methods.
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