作者: Wei Qin , Yiping Guo , Bing Guo , Mingyuan Gu
DOI: 10.1016/J.JALLCOM.2011.10.011
关键词: Dielectric loss 、 Band gap 、 Scanning electron microscope 、 Optoelectronics 、 Permittivity 、 Dielectric 、 Materials science 、 Optics 、 Thin film 、 Refractive index 、 Sol-gel
摘要: … thin films were deposited onto SiO 2 /Si substrates via a sol–gel method, with LaNiO 3 as buffer layer… work, we have prepared BFO solid solution thin films with Na 0.5 Bi 0.5 TiO 3 (NBT). …