Charge Percolation Pathways Guided by Defects in Quantum Dot Solids

作者: Yingjie Zhang , Danylo Zherebetskyy , Noah D. Bronstein , Sara Barja , Leonid Lichtenstein

DOI: 10.1021/ACS.NANOLETT.5B00454

关键词: Kelvin probe force microscopeScanning tunneling spectroscopyChemistryCondensed matter physicsElectronSemiconductorQuantum dotElectronic structurePercolationDoping

摘要: Charge hopping and percolation in quantum dot (QD) solids has been widely studied, but the microscopic nature of the percolation process is not understood or determined. Here we …

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