Specimen preparation of irradiated materials for examination in the atom probe field ion microscope

摘要: The atom probe field ion microscope (APFIM) requires specimens in the form of ultrasharp needles. Basic protective measures used to reduce exposure druing specimen preparation are discussed. low-level radioactive blanks may be made using a two-stage electropolishing process thin layer electrolyte floating on denser inert liquid; this produces necked region and eventually two from each single blank. amount material handled also reduced micropolishing technique repolish blunt or fractured specimens. Control contamination possible spills is