Atom probe field-ion microscopy: A technique for microstructural characterization of irradiated materials on the atomic scale
作者： M. K. Miller , M. G. Hetherington , M. G. Burke
DOI: 10.1007/BF02670158
关键词: Metallurgy 、 Atomic units 、 Microscopy 、 Irradiation 、 Image resolution 、 Characterization (materials science) 、 Molecular physics 、 Atom probe 、 Materials science 、 Analytical chemistry 、 Structural material 、 Field ion microscope
摘要: Atom probe field-ion microscopy (APFIM) is well suited to the microstructural characterization of ultrafine-scale features that are formed in materials during irradiation. The atomic spatial resolution this technique permits a complete and chemical description ultrafine control mechanical properties be made. A types analyses may performed presented.
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