Microstructure and magnetic properties of CoCr thin films formed on Ge layer
作者： M. Futamoto , Y. Honda , H. Kakibayashi , K. Yoshida
DOI: 10.1109/TMAG.1985.1064012
关键词: Materials science 、 Nucleation 、 Alloy 、 Layer (electronics) 、 Optics 、 Thin film 、 Transmission electron microscopy 、 Microstructure 、 Alloy deposition 、 Composite material 、 Crystal
摘要: To improve the c-axis oriented columnar growth, nucleation of CoCr crystals on various underlayers which are formed substrates prior to alloy deposition is studied. Microstructures vacuum deposited films examined by transmission electron microscopy (TEM). It found that an amorphous-like Ge a suitable underlayer material prepare highly films. Cross-sectional TEM study indicates film layer consists pillarlike grown vertically throughout thickness. The has large perpendicular magnetic anisotropy. read-write (R/W) characteristics have been markedly improved using and very high recording density D 50 =230 kFCI achieved, role crystal discussed.
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