On the formation of paramagnetic defects in ion-implanted fluoroaluminate glasses

作者: L.D. Bogomolova , Yu.G. Teplyakov , V.A. Jachkin , V.L. Bogdanov , V.D. Khalilev

DOI: 10.1016/0022-3093(96)00167-6

关键词: Spectral lineParamagnetismIonFluorideFluorineg-factorOxideChemistryElectron paramagnetic resonanceNuclear chemistryAnalytical chemistry

摘要: Abstract The spectra of electron paramagnetic resonance (EPR) fluoroaluminate glass (FAG-36) based on mineral usovite Ba2CaMgAlF14 were studied. centers responsible for EPR signals induced by ion bombardment the substrates prepared from this glass. B+, N+, O+, Ar+, Mn2+, Cu2+ and Pb+ ions with energy E = 150 keV used. integrated dose, D, was 2 × 1016 ions/cm2. It is shown means isochronal anneal experiments computer simulation that they contain three components: broad Gaussian line (GL) g 2.016 σ 30 ÷ 45; anisotropic (A) spectrum gz 2.0175; gy 2.009 gx 2.001 (±0.001) narrow isotropic Lorentzian shape 2.0025 (±0.0005) ΔH 0.6(±0.05) mT. comparison obtained results literature data γ-irradiated fluoride glasses ion-implanted oxide different compositions permitted to conclude GL due hole defects, typical localized several anions (fluorine oxygen(s)), A-spectrum belongs molecular O2 ions, S-signal can be supposedly attributed big (O2O−, O4−, CO− or CO+) located in voids damaged implantation layer.

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