Two Series Oxide Resistors Applicable to High Speed and High Density Nonvolatile Memory

作者: M.-J. Lee , Y. Park , D.-S. Suh , E.-H. Lee , S. Seo

DOI: 10.1002/ADMA.200700251

关键词: ResistorSeries (mathematics)High densityMaterials scienceNanotechnologyOptoelectronicsNon-volatile memoryOxide

摘要: … Two monitoring pulses of triangular shape and one programming pulse located between monitoring pulses are applied to test memory cell (device under test, DUT) using Agilent …

参考文章(13)
I.G. Baek, M.S. Lee, S. Sco, M.J. Lee, D.H. Seo, D.-S. Suh, J.C. Park, S.O. Park, H.S. Kim, I.K. Yoo, U.-I. Chung, J.T. Moon, Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses international electron devices meeting. pp. 587- 590 ,(2004) , 10.1109/IEDM.2004.1419228
J.E. Brewer, V.V. Zhirnov, J.A. Hutchby, Memory technology for post CMOS era IEEE Circuits & Devices. ,vol. 21, pp. 13- 20 ,(2005) , 10.1109/MCD.2005.1414313
S. Jeon, C. Lee, K. Kim, K.-T. Park, J. Choi, J. Sel, V. Kim, C. Kang, Y. Shin, U. Roh, J. Park, J.-S. Lee, J. Sim, A 64-Cell NAND Flash Memory with Asymmetric S/D Structure for Sub-40nm Technology and Beyond symposium on vlsi technology. pp. 19- 20 ,(2006) , 10.1109/VLSIT.2006.1705196
Y. Muraoka, Z. Hiroi, Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates Applied Physics Letters. ,vol. 80, pp. 583- 585 ,(2002) , 10.1063/1.1446215
Shinya Tanifuji, Kenji Matsunaga, Kichinosuke Yahagi, On the Mechanism of Threshold Switching in Titanium Oxide Japanese Journal of Applied Physics. ,vol. 12, pp. 150- 151 ,(1973) , 10.1143/JJAP.12.150
M.-J. Lee, S. Seo, D.-C. Kim, S.-E. Ahn, D. H. Seo, I.-K. Yoo, I.-G. Baek, D.-S. Kim, I.-S. Byun, S.-H. Kim, I.-R. Hwang, J.-S. Kim, S.-H. Jeon, B. H. Park, A Low-Temperature-Grown Oxide Diode as a New Switch Element for High-Density, Nonvolatile Memories† Advanced Materials. ,vol. 19, pp. 73- 76 ,(2007) , 10.1002/ADMA.200601025
Choong-Rae Cho, SungIl Cho, Sidorkin Vadim, Ranju Jung, Inkyeong Yoo, Current-induced metal insulator transition in VOx thin film prepared by rapid-thermal-annealing Thin Solid Films. ,vol. 495, pp. 375- 379 ,(2006) , 10.1016/J.TSF.2005.08.241
S. Q. Liu, N. J. Wu, A. Ignatiev, Electric-pulse-induced reversible resistance change effect in magnetoresistive films Applied Physics Letters. ,vol. 76, pp. 2749- 2751 ,(2000) , 10.1063/1.126464
S. Seo, M. J. Lee, D. H. Seo, E. J. Jeoung, D.-S. Suh, Y. S. Joung, I. K. Yoo, I. R. Hwang, S. H. Kim, I. S. Byun, J.-S. Kim, J. S. Choi, B. H. Park, Reproducible resistance switching in polycrystalline NiO films Applied Physics Letters. ,vol. 85, pp. 5655- 5657 ,(2004) , 10.1063/1.1831560
Y. Watanabe, J. G. Bednorz, A. Bietsch, Ch. Gerber, D. Widmer, A. Beck, S. J. Wind, Current-driven insulator–conductor transition and nonvolatile memory in chromium-doped SrTiO3 single crystals Applied Physics Letters. ,vol. 78, pp. 3738- 3740 ,(2001) , 10.1063/1.1377617