FIB Preparation of a NiO Wedge-Lamella and STEM X-Ray Microanalysis for the Determination of the Experimental k (O-Ni) Cliff-Lorimer Coefficient
作者： Aldo Armigliato , Stefano Frabboni , Gian Carlo Gazzadi , Rodolfo Rosa
DOI: 10.1017/S1431927612013876
关键词: Analytical chemistry 、 Monte Carlo method 、 Fabrication 、 Scanning transmission electron microscopy 、 Microanalysis 、 Transmission electron microscopy 、 Focused ion beam 、 Lamella (surface anatomy) 、 Materials science 、 Non-blocking I/O
摘要: A method for the fabrication of a wedge-shaped thin NiO lamella by focused ion beam is reported. The starting sample an oxidized bulk single crystalline, oriented, Ni commercial standard. employed determination, analytical electron microscopy at 200 kV experimental k(O-Ni) Cliff-Lorimer (G. Cliff & G.W. Lorimer, J Microsc 103, 203-207, 1975) coefficient, according to extrapolation Van Cappellen (E. Cappellen, Microstruct Microanal 1, 1-22, 1990). result thus obtained compared theoretical values either implemented into software X-ray microanalysis quantification scanning transmission microscopy/energy dispersive spectrometry equipment or calculated Monte Carlo method. Significant differences among three are found. This confirms that reliable binary alloys containing light elements, choice coefficients crucial and recommended.
harvard.edu
sci-hub.se 参考文章(14)
David B. Williams, C. Barry Carter, Quantitative X-ray Analysis Springer, Boston, MA. pp. 155- 217 ,(1986) , 10.1007/978-0-387-76501-3_35
C.R Hutchinson, R.E Hackenberg, G.J Shiflet, A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils. Ultramicroscopy. ,vol. 94, pp. 37- 48 ,(2003) , 10.1016/S0304-3991(02)00193-6
R. Herchl, N. N. Khoi, T. Homma, W. W. Smeltzer, Short-circuit diffusion in the growth of nickel oxide scales on nickel crystal faces Oxidation of Metals. ,vol. 4, pp. 35- 49 ,(1972) , 10.1007/BF00612506
A. D. Westwood, J. R. Michael, M. R. Notis, Experimental determination of light‐element k‐factors using the extrapolation technique: Oxygen segregation in aluminium nitride Journal of Microscopy. ,vol. 167, pp. 287- 302 ,(1992) , 10.1111/J.1365-2818.1992.TB03239.X
I. M. ANDERSON, J. BENTLEY, C. B. CARTER, The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope Journal of Microscopy. ,vol. 178, pp. 226- 239 ,(1995) , 10.1111/J.1365-2818.1995.TB03600.X
C. HOLZAPFEL, F. SOLDERA, E. A. FAUNDEZ, F. MÜCKLICH, Site-specific structural investigations of oxidized nickel samples modified by plasma erosion processes. Journal of Microscopy. ,vol. 227, pp. 42- 50 ,(2007) , 10.1111/J.1365-2818.2007.01781.X
R. Rosa, A. Armigliato, Monte carlo simulation of thin-film X-ray microanalysis at high energies X-Ray Spectrometry. ,vol. 18, pp. 19- 23 ,(1989) , 10.1002/XRS.1300180106
Eric Van Cappellen, The parameterless correction method in X-ray microanalysis Microscopy Microanalysis Microstructures. ,vol. 1, pp. 1- 22 ,(1990) , 10.1051/MMM:01990001010100
R.F. Egerton, S.C. Cheng, Characterization of an analytical electron microscope with a NiO test specimen Ultramicroscopy. ,vol. 55, pp. 43- 54 ,(1994) , 10.1016/0304-3991(94)90079-5
L. A. Giannuzzi, J. L. Drown, S. R. Brown, R. B. Irwin, F. A. Stevie, Focused Ion Beam Milling and Micromanipulation Lift-Out for Site Specific Cross-Section Tem Specimen Preparation MRS Proceedings. ,vol. 480, pp. 19- 27 ,(1997) , 10.1557/PROC-480-19