作者: M. Archanaa , Karthigha Balamurugan , M. Jayakumar
DOI: 10.1109/EMBEDDEDSYS.2014.6953047
关键词: Shot noise 、 Noise generator 、 Noise figure 、 Control theory 、 Flicker noise 、 Electronic engineering 、 Y-factor 、 Effective input noise temperature 、 Noise (electronics) 、 Engineering 、 Noise temperature
摘要: Scaling of MOSFET increases the device performance in terms speed, current drive, operating frequency and many other parameters; but on end, noise aggravates due to shrinking dimensions. Although several sources are present recent submicron device, equivalent thermal is considered as a prominent one. This paper deals with analysis computation various available models also focuses design implementation MOS-based all-pass filter using appropriate model. Thus drawbacks currently which do not include model, have been considerably overcome. Simulation results MOS based all pass without inclusion model discussed hence accuracy improved.