Mechanical Properties of Silicon Carbide Nanowires: Effect of Size- Dependent Defect Density
作者： Guangming Cheng , Tzu-Hsuan Chang , Qingquan Qin , Hanchen Huang , Yong Zhu
DOI: 10.1021/NL404058R
关键词: Flexural strength 、 Composite material 、 Nanomechanics 、 Fracture (geology) 、 Ultimate tensile strength 、 Stacking fault 、 Silicon carbide 、 Materials science 、 Scanning electron microscope 、 Nanowire
摘要: … (NWs) via in situ tensile tests inside scanning electron … Stacking faults (SFs) are also common in SiC due to the low … TEM images of more NWs with the three types of structures …
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