作者: Il-Han Hwang , Jong-Hyun Lee
DOI: 10.1109/MEMSYS.2006.1627773
关键词: Optics 、 Voltage 、 Mechanics 、 Deep reactive-ion etching 、 System of measurement 、 Spring (device) 、 Normal force 、 Dynamical friction 、 Beam (structure) 、 Actuator 、 Materials science
摘要: A silicon friction meter employing simple beam springs with holding and driving comb actuators was suggested to evaluate the static dynamic coefficients of DRIE sidewalls. After moving shuttle a certain position, symmetric normal force applied on sidewalls by actuators. By ramp increasing voltage, slide distance measured considering spring nonlinearity. The effects contact width, number points were investigated.