Universal Testing Apparatus Implementing Various Repetitive Mechanical Deformations to Evaluate the Reliability of Flexible Electronic Devices.
作者： Cheol Kim , Chung Kim
DOI: 10.3390/MI9100492
关键词: Shearing (physics) 、 Electrode 、 Bending 、 Printed electronics 、 Deformation (engineering) 、 Flexible electronics 、 Structural engineering 、 Electronics 、 Reliability (semiconductor) 、 Materials science
摘要: A requirement of flexible electronic devices is that they maintain their electrical performance during and after repetitive mechanical deformation. Accordingly, in this study, a universal …
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