Reliability of Sputtered Aluminum Thin Film on Flexible Substrate Under High Cyclic Bending Fatigue Conditions
作者： Mohammad M. Hamasha , Khalid Alzoubi , James C. Switzer , Susan Lu , Mark D. Poliks
DOI: 10.1109/TCPMT.2012.2214034
关键词:
摘要: Aluminum thin films on flexible substrates are very popular as a back electrode in solar photovoltaic technology. However, during their manufacturing and use, the package is subject to cyclic bending, which leads cracks conductive film ultimately failure of package. This paper investigates effect thickness, bending diameter (BD), number cycles (NOC) crack development percentage change electrical resistance (PCER) aluminum under conditions. PCER-NOC diagrams constructed at all considered factor-level combinations. These curves used comparisons between high low levels BD thickness. The Design Experiment tool investigate significance BD, NOC, interactions them PCER. In this regard, factors found be significant. Furthermore, thickness-NOC BD-NOC significant, while thickness-BD interaction not Moreover, finite element model built area highest stress film, other words, with most fatigue potential.
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