Depth profiling of the residual activity induced in carbon-based materials by heavy ions (The 12th International Conference on Radiation Shielding (ICRS-12) and the 17th Topical Meeting of the Radiation Protection and Shielding Division of ANS (RPSD-2012)) -- (Activation Measurement and Analysis)
作者： Ivan Strasik , Vera Chetvertkova , Edil Mustafin , Marilena Tomut , Anton Belousov
DOI: 10.15669/PNST.4.367
关键词: Radiochemistry 、 Physics 、 Material physics 、 Nuclear engineering 、 Electromagnetic shielding 、 Technical university 、 Residual activity 、 Radiation shielding 、 Heavy ion 、 Radiation protection
摘要: Ivan Strasik, Vera Chetvertkova, Edil Mustafin, Marilena Tomut and Anton Belousov GSI Helmholtz Centre for Heavy Ion Research, Planckstrasse 1, D-64291 Darmstadt, Germany; IAP Goethe University, Max-von-Laue-Strasse D-60438 Frankfurt am Main, National Institute of Materials Physics, Atomistilor 105, 077125 Bucharest-Magurele, Romania; Technical University Karolinenplatz 5, D-64289 Germany
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