Birefringence enhancement in annealed TiO2 thin films

作者: Andy C. van Popta , June Cheng , Jeremy C. Sit , Michael J. Brett

DOI: 10.1063/1.2752132

关键词: Amorphous solidComposite materialAnnealing (metallurgy)EllipsometryOpticsMaterials scienceCrystalliteRefractive indexThin filmVacuum depositionBirefringence

摘要: Postdeposition thermal annealing is used to enhance the form birefringence of nanostructured TiO2 thin films grown by electron-beam evaporation using serial bideposition technique. Thin were on fused silica substrates oblique deposition angles between 60° and 75° repetitive 180° substrate rotations produce birefringent that are structurally anisotropic. in air, 200 900°C, was increase changing phase from as-deposited amorphous state a polycrystalline exhibits greater inherent density larger bulk refractive index. The optical properties, microstructure, crystallinity characterized Mueller matrix ellipsometry, scanning electron microscopy, atomic force x-ray diffraction. It found in-plane increased significantly upon annealing, some cases yielding values doubled magn...

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