Powered testing of mixed conventional/boundary-scan logic
作者： Kenneth P. Parker , Kenneth E. Posse
DOI:
关键词: Interval (mathematics) 、 Forcing (recursion theory) 、 Cartesian coordinate system 、 Printed circuit board 、 Topology 、 Node (computer science) 、 Logic state 、 Boundary scan 、 Mathematics 、 Test method 、 Real-time computing
摘要: A method for testing a circuit board having both boundary-scan and non-boundary-scan devices is provided. The test distinguishes nodes from uses cartesian coordinates (X,Y) of every pin device on the to determine number sets that are within predetermined distance "R" coupled node. grouped into "independent" groups which can be tested in parallel. cycle performed by independent parallel forcing drivers first logic state, each another state brief interval. Receivers capture response vector during interval, scanned out evaluation. reflects has failed, coordinate data giving precise location any faulty node(s) returned user.
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