Partitioned boundary-scan testing for the reduction of testing-induced damage
作者： Kenneth P. Parker
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摘要: A partitioned boundary-scan interconnect test method for loaded printed wiring boards (PWB's) is disclosed which reduces testing-induced damage to electronic components. The adapted expeditiously identify all short-circuits on a PWB. includes four sub-tests. powered shorts sub-test searches short-circuit faults between conventional nets and nets. optimized by testing single driver each net. All other drivers are tested during bus-wire sub-test. in-circuit checks the connectivity of devices in partial (i.e., having or receiver but not both). By partitioning into these sub-tests, potential reduced.
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