IEEE P1149 Proposed Standard Testability Bus-An update with case histories

摘要: The author outlines the history of IEEE P1149 proposed standard testability bus and describes latest version bus, which is now structured to include four distinct subsets (any or all may be used in any combination). Included are illustrations implementations using circuitry dedicated also that performs both needed circuit functions interface functions. Built-in test examples included. concludes with a summary time-to-market economic advantages description current status effort plus plans timetable for future. >