作者: D L Misell , G W Stroke , M Halioua
DOI: 10.1088/0022-3727/7/10/103
关键词: Optics 、 Electron microscope 、 Scanning transmission electron microscopy 、 Microscope 、 Materials science 、 Annular dark-field imaging 、 Conventional transmission electron microscope 、 Electron tomography 、 Scanning confocal electron microscopy 、 High-resolution transmission electron microscopy
摘要: … incoherent illumination in the CEM. In order to correct this impression we outline in this letter how the STEM image can correspond to either coherent or incoherent … an incoherent mode, …