Influence of initial power stabilization over crystalline-Si photovoltaic modules maximum power

作者: MA Munoz , Faustino Chenlo , María del Carmen Alonso‐García , None

DOI: 10.1002/PIP.1052

关键词: Reduction (complexity)Power (physics)Work (thermodynamics)Engineering physicsMaximum power principleElectrical engineeringMaterials sciencePhotovoltaic system

摘要: Measurements that suppliers offer in specification sheets are not always close to the actual power measured independent laboratories such as CIEMAT. Independent measurements tend be lower than those printed on label sometimes even allowed tolerance indicated by manufacturer same label. Furthermore, a potentially significant reduction has been reported when Standard EN50380 (which requires photovoltaic (PV) modules exposed more 20 kWh/m2 of sunlight prior taking appear label) is followed. This initial stabilization and this work studies tends crystalline PV modules. Crystalline usually decrease around 1%, but decreases >4% have also reported. These losses only detected after mentioned stabilization. Copyright © 2010 John Wiley & Sons, Ltd.

参考文章(9)
N. Vela, M. Alonso-Abella, F. Fabero, J.P. Silva, F. Chenlo, PV Module Peak Power: Comparison Between Manufacturer Data and Laboratory Results 23rd European Photovoltaic Solar Energy Conference and Exhibition, 1-5 September 2008, Valencia, Spain. pp. 2837- 2840 ,(2008) , 10.4229/23RDEUPVSEC2008-4AV.3.21
J. Schmidt, K. Bothe, R. Hezel, Formation and annihilation of the metastable defect in boron-doped Czochralski silicon Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002.. pp. 178- 181 ,(2002) , 10.1109/PVSC.2002.1190485
B. Marion, A method for modeling the current–voltage curve of a PV module for outdoor conditions Progress in Photovoltaics. ,vol. 10, pp. 205- 214 ,(2002) , 10.1002/PIP.403
Manuel Vázquez, Ignacio Rey‐Stolle, Photovoltaic module reliability model based on field degradation studies Progress in Photovoltaics. ,vol. 16, pp. 419- 433 ,(2008) , 10.1002/PIP.825
Karsten Bothe, Rudolf Hezel, Jan Schmidt, Recombination-enhanced formation of the metastable boron-oxygen complex in crystalline silicon Applied Physics Letters. ,vol. 83, pp. 1125- 1127 ,(2003) , 10.1063/1.1600837
C.R. Osterwald, S. Rummel, L. Ottoson, A. Anderberg, J. Pruett, J.P. Benner, Degradation in weathered crystalline-silicon PV modules apparently caused by UV radiation 3rd World Conference onPhotovoltaic Energy Conversion, 2003. Proceedings of. ,vol. 3, pp. 2911- 2915 ,(2003)
David W. Coit, John L. Evans, Nathan T. Vogt, James R. Thompson, A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules Quality and Reliability Engineering International. ,vol. 21, pp. 715- 726 ,(2005) , 10.1002/QRE.710