作者: Alessandra Colli , Johan Vasquez , Willem J. Zaaiman
DOI: 10.1016/J.RENENE.2014.09.062
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摘要: Abstract The paper discusses the methodology and presents results of stabilization process for a statistic forty-four monocrystalline silicon photovoltaic (PV) modules. modules have been exposed to real sunlight in three different sessions measured prior exposure after each session using pulsed sun simulator. first shows highest power loss modules, with an average 1.8%. During this initial step, 17 had maximum above 2% (registered losses from 2.1% 2.8%). overall are range 1.7–3.4%, 2.4% considered module population. Visual inspection analysis I–V curves revealed some imperfections However, those do not impact on actual performance at present time. After stabilization, installed Northeast Solar Energy Research Center (NSERC) array, located Brookhaven National Laboratory. array will be used analyze degradation environmental conditions study grid utility-level PV plants.