作者: Seema Thakral , Maxwell W. Terban , Naveen K. Thakral , Raj Suryanarayanan
DOI: 10.1016/J.ADDR.2015.12.013
关键词: Nanocrystalline material 、 Nanotechnology 、 Amorphous solid 、 Diffraction 、 Analytical chemistry 、 X-ray crystallography 、 Pair distribution function 、 Crystallization 、 International Centre for Diffraction Data 、 Characterization (materials science) 、 Materials science
摘要: … In order to quantify the crystalline content in an amorphous solid dispersion using XRD, the classic method based on estimation of integrated intensity counts for the characteristic peak/s …