Recent advances in the characterization of amorphous pharmaceuticals by X-ray diffractometry.

作者: Seema Thakral , Maxwell W. Terban , Naveen K. Thakral , Raj Suryanarayanan

DOI: 10.1016/J.ADDR.2015.12.013

关键词: Nanocrystalline materialNanotechnologyAmorphous solidDiffractionAnalytical chemistryX-ray crystallographyPair distribution functionCrystallizationInternational Centre for Diffraction DataCharacterization (materials science)Materials science

摘要: … In order to quantify the crystalline content in an amorphous solid dispersion using XRD, the classic method based on estimation of integrated intensity counts for the characteristic peak/s …

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