作者: Andrew B. Horn , Sally F. Banham , Martin R. S. McCoustra
DOI: 10.1039/FT9959104005
关键词: Chemistry 、 Radiation 、 Wavelength 、 Water ice 、 Substrate (electronics) 、 Analytical chemistry 、 Thin film 、 Metal 、 Relaxation (NMR) 、 Absorption spectroscopy
摘要: The effect of film thickness upon the shape OH stretching band thin films water ice on a gold substrate has been analysed using classical optics. structure observed in with thicknesses comparable to wavelength IR radiation arises because combination an increased specularly reflected component, s-polarised component and relaxation metal surface selection rule.