作者: E.N. Borisov , V.B. Smirnov , A. Tverjanovich , Yu.S. Tveryanovich
DOI: 10.1016/S0022-3093(03)00421-6
关键词: Laser ablation 、 Spectroscopy 、 Pulsed laser deposition 、 Thin film 、 Materials science 、 Luminescence 、 Analytical chemistry 、 Photoluminescence 、 Chalcogenide glass 、 Absorption spectroscopy
摘要: Abstract The Ga2S3–GeS2:Er2S3 films of various thicknesses (from 0.3 to 5 μm) were prepared by laser ablation. deposed characterized with diagnostic techniques: optical absorption spectroscopy, X-ray fluorescence secondary ion mass spectroscopy and luminescence spectroscopy. Concentrations rare-earth ions, gallium germanium in the target bulk glass similar. composition deposited was uniform. location fundamental edge range from about 350 550 nm depended on deposition conditions. UV irradiation led a large photo bleaching effect. spectrum film measured.