Particle Analyzer Diagnostics for Intense Particle Beam Measurements
作者： D. J. Johnson , W. A. Stygar , R. J. Leeper , J. R. Lee , L. Wissel
DOI: 10.1007/978-94-017-0445-8_11
关键词: Particle beam 、 Ion beam 、 Spectrum analyzer 、 Current density 、 Beam (structure) 、 Voltage 、 Power density 、 Materials science 、 Optics 、 Diode
摘要: One of the most important measurements that can be performed on an intense high-current density ion beam is a direct measurement beam’s time-resolved energy spectrum. This allows determination current density, power current, and voltage as function time. These quantities are all obvious importance in characterizing any beam. In addition, comparison spectrum, with distribution, inferred from line monitor study A-K gap loss mechanisms effects neutral gas diode performance.
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