作者: Jun Zhu , Jun Luo , Qing Meng Zhang , Qun Tang , Jun Du
DOI: 10.4028/WWW.SCIENTIFIC.NET/MSF.687.457
关键词: Electrode 、 Capacitor 、 Microstructure 、 Dielectric 、 Electronic engineering 、 Glass-ceramic 、 Thin film 、 Composite material 、 Dielectric loss 、 Materials science 、 Diffusion
摘要: The electrical properties and microstructure of Na2O−PbO−Nb2O5−SiO2 glass-ceramic capacitors with pre-sputtered gold film as the transition layer in electrode design were investigated. SEM observation EDS analysis showed that presence would eliminate enormously Ag diffusion into dielectric layer, resulting a smooth dense interface contact less porous defects near electrode/dielectric region. property results indicated leakage current loss had decreased by about an order magnitude 20%, respectively. These explained weakened silver due to between paste/dielectric interface.