Defects of Base Metal Electrode Layers in Multi-Layer Ceramic Capacitor

作者: Bang-Ying Yu , Wen-Cheng J. Wei

DOI: 10.1111/J.1551-2916.2005.00431.X

关键词: Ceramic capacitorDielectricMaterials scienceCapacitorElectrodeBase metalComposite materialSinteringDiscontinuity (geotechnical engineering)MineralogyOptical microscope

摘要: An ultra-thin Ni-based metal used as the electrode layer in multilayer ceramic capacitor determines dielectric performance of capacitor. The warpage and continuity inner layers, a dihedral angle between BaTiO3 layers electrodes two capacitors (X7R X5R) were characterized by optical microscopy scanning/transmission electron microscopes. results show that chips is closely related to discontinuity electrode. takes place mainly because Rayleigh instability Ni layer, but less induced tensile stress from sintering.

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