作者: Bang-Ying Yu , Wen-Cheng J. Wei
DOI: 10.1111/J.1551-2916.2005.00431.X
关键词: Ceramic capacitor 、 Dielectric 、 Materials science 、 Capacitor 、 Electrode 、 Base metal 、 Composite material 、 Sintering 、 Discontinuity (geotechnical engineering) 、 Mineralogy 、 Optical microscope
摘要: An ultra-thin Ni-based metal used as the electrode layer in multilayer ceramic capacitor determines dielectric performance of capacitor. The warpage and continuity inner layers, a dihedral angle between BaTiO3 layers electrodes two capacitors (X7R X5R) were characterized by optical microscopy scanning/transmission electron microscopes. results show that chips is closely related to discontinuity electrode. takes place mainly because Rayleigh instability Ni layer, but less induced tensile stress from sintering.