作者: C.C. Lin , W.C.J. Wei , C.Y. Su , C.H. Hsueh
DOI: 10.1016/J.JALLCOM.2009.06.050
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摘要: Abstract High temperature heat treatment of internal Ni electrode and BaTiO3 dielectric layers is one the important steps in sintering process multilayer ceramic capacitors (MLCCs). In this study, microstructural analysis partially oxidized was conducted. Sub-micrometric NiO scales were found along interface Ni/BaTiO3. addition, capacitance, loss, isolation resistances samples after post-treatment N2 atmosphere at 1000 °C for 0–8 h analyzed. A detailed on discussion formation mechanism are presented paper.