Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency
作者： O Solís Canto , EA Murillo-Bracamontes , JJ Gervacio-Arciniega , M Toledo-Solano , G Torres-Miranda
DOI: 10.1063/5.0013287
关键词: Ferroelectricity 、 Voltage 、 Cantilever 、 Thin film 、 Resonance 、 Condensed matter physics 、 Piezoresponse force microscopy 、 Electrostriction 、 Spring (device) 、 Materials science
摘要: Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO3/DyScO3(110) thin film, obtained with long (kc = 0.82 N/m) and short (kc = 7.64 N/m) cantilevers, were analyzed as function the applied voltage frequency. For electrostatic electrostrictive contributions identified. These reduced frequency near second mode contact resonance; while for first was necessary. A method domain structure analyses, to discriminate ferroelectric behavior from non-ferroelectric, through optimization PFM images, is also described. The analysis can be extended cantilevers different spring constants materials.
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