Selective area control of self-assembled pattern architecture using a lithographically patternable block copolymer.

作者: Joan K. Bosworth , Charles T. Black , Christopher K. Ober

DOI: 10.1021/NN900343U

关键词: PhotoresistThin filmCopolymerPolymerSelf-assemblyWaferPhase (matter)Chemical engineeringUltraviolet lightMaterials sciencePolymer chemistry

摘要: We leverage distinctive chemical properties of the diblock copolymer poly(α-methylstyrene)-block-poly(4-hydroxystyrene) to create for first time high-resolution selective-area regions two different block phase morphologies. Exposure thin films nonselective or block-selective solvent vapors results in polymer separation and self-assembly patterns cylindrical-phase kinetically trapped spherical-phases, respectively. Poly(4-hydroxystyrene) acts as a negative-tone photoresist presence small amounts photoacid generator cross-linker, undergoing radiation-induced cross-linking upon exposure ultraviolet light an electron beam. use lithographic lock one self-assembled morphology specific sample areas 100 nm width prior film subsequent vapor form second unexposed wafer areas.

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