作者: A. Burian , J. Auleytner
DOI: 10.1016/S0022-3093(87)80081-9
关键词: Diffraction 、 Chemistry 、 Electron backscatter diffraction 、 Reflection high-energy electron diffraction 、 Optics 、 Thin film 、 Electron diffraction 、 Microcrystalline 、 Analytical chemistry 、 Amorphous solid 、 Scanning electron microscope
摘要: Electron diffraction experiments have been performed on amorphous Cd 47 As 53 and Zn 43 P 57 films using a scanning electron system with energy filtering. The data analysed by comparison of the experimental correlation functions microcrystalline calculations based intermediate between CdSb type Si III structure. model Gaussian distribution interatomic distances has found to be suitable as description these materials.