Electron diffraction studies of the Cd47As53 and Zn43P57 amorphous films

作者: A. Burian , J. Auleytner

DOI: 10.1016/S0022-3093(87)80081-9

关键词: DiffractionChemistryElectron backscatter diffractionReflection high-energy electron diffractionOpticsThin filmElectron diffractionMicrocrystallineAnalytical chemistryAmorphous solidScanning electron microscope

摘要: Electron diffraction experiments have been performed on amorphous Cd 47 As 53 and Zn 43 P 57 films using a scanning electron system with energy filtering. The data analysed by comparison of the experimental correlation functions microcrystalline calculations based intermediate between CdSb type Si III structure. model Gaussian distribution interatomic distances has found to be suitable as description these materials.

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