摘要: An improved transmission scanning electron diffraction system is described. It can make angular measurements comparable with those of photographic instruments, its intensity have an accuracy ±0.2% for single traces, ±1% complete frames, sensitivity sufficient to give clear signals from specimens average thickness equal atomic layer, resolving power 0.23 mrad. Important features the are a high productivity rate so that many be grown within instrument and examined in short time; ability record patterns continuously as films by vacuum deposition growth rate/vacuum values up 107 A sec−1 Torr−1; scan two dimensions. Scan rates depend on response speed X‐Y recorder used 10–50 sec trace, 20–60 min entire frame crystal film. The design discussed results polycrystal...
scitation.org
harvard.edu
aip.org
sci-hub.se 参考文章(9)
M. Horstmann, G. Meyer, Eine Gegenfeldanordnung zur Messung von Energie- und Winkelverteilungen gestreuter Elektronen European Physical Journal. ,vol. 159, pp. 563- 583 ,(1960) , 10.1007/BF01366385
Z.G. Pinsker, Lewis B. Leder, Electron Diffraction Structure Analysis and the Investigation of Semiconducting Materials Advances in Electronics and Electron Physics. ,vol. 11, pp. 355- 412 ,(1959) , 10.1016/S0065-2539(08)60998-1
M. Kodama, M. Kitamura, GEOMAGNETIC STORM EFFECT ON THE SOLAR COSMIC-RAYS IN NOVEMBER 1960 AND THEIR PROPAGATION PROCESS IN THE INTERPLANETARY SPACE Journal of the Physical Society of Japan. ,vol. 17, pp. 298- ,(1962)
K.H. Behrndt, R.W. Love, Automatic control of film-deposition rate with the crystal oscillator for preparation of alloy films Vacuum. ,vol. 12, pp. 1- 9 ,(1962) , 10.1016/0042-207X(62)90818-7
Karl Brack, Über eine Anordnung zur Filterung von Elektroneninterferenzen Zeitschrift für Naturforschung A. ,vol. 17, pp. 1066- 1070 ,(1962) , 10.1515/ZNA-1962-1205
C. W. B. GRIGSON, D. B. DOVE, G. R. STILWELL, Some Applications of an Improved Scanning Electron Diffraction System Nature. ,vol. 205, pp. 1198- 1199 ,(1965) , 10.1038/2051198A0
C. W. B. GRIGSON, High-Speed Direct-Recording System for Electron Diffraction Nature. ,vol. 192, pp. 647- 648 ,(1961) , 10.1038/192647A0
P N Denbigh, C W B Grigson, Scanning electron diffraction with energy analysis Journal of Scientific Instruments. ,vol. 42, pp. 305- 311 ,(1965) , 10.1088/0950-7671/42/5/301
C. W. B. GRIGSON, D. B. DOVE, G. R. STILWELL, Amorphous Magnetic Films Nature. ,vol. 204, pp. 173- 173 ,(1964) , 10.1038/204173A0