Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data.

摘要: An automated procedure has been developed for the reconstruction of field ion microscopy (FIM) data that maintains its atomistic nature. FIM characterizes individual atoms on specimen’s surface, evolving subject to evaporation, in a series two-dimensional (2D) images. Its unique spatial resolution enables direct imaging crystal defects as small single vacancies. To fully exploit FIM’s potential, analysis tools are required. The algorithm here relies minimal assumptions and is sensitive atomic coordinates all imaged atoms. It tracks across sequence images, allocating each respective crystallographic plane. result highly accurate 3D lattice-resolved reconstruction. applied over 2000 tungsten atoms, including ion-implanted planes. approach further adapted analyze carbides steel matrix, demonstrating applicability range materials. A vast amount information collected during experiment can underpin advanced analyses such detection “out sequence” events, subangstrom surface displacements effects neighboring These have potential reveal new insights into evaporation process contribute improving accuracy scope atom probe characterization.