A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM

摘要: Abstract We introduce an extended Contrast Transfer Function (CTF) approach for the calculation of image formation in low energy electron microscopy (LEEM) and photo emission (PEEM). This considers aberrations up to fifth order, appropriate state-of-the-art aberration-corrected LEEM PEEM. derive Scherzer defocus values both weak strong phase objects, as well pure amplitude non-aberration-corrected LEEM. Using CTF formalism, we calculate contrast resolution one-dimensional two-dimensional phase, amplitude, mixed objects. PEEM imaging is treated by adapting this case incoherent imaging. Based on these calculations, show that ultimate about 0.5 nm, 3.5 nm. The aperture sizes required achieve resolutions are precisely determined with method. formalism discussed here also relevant high transmission microscopy.