A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.
作者： R.M. Tromp , J.B. Hannon , W. Wan , A. Berghaus , O. Schaff
DOI: 10.1016/J.ULTRAMIC.2012.07.016
关键词:
摘要: In Part I we described a new design for an aberration-corrected Low Energy Electron Microscope (LEEM) and Photo Emission (PEEM) equipped with in-line electron energy filter. The chromatic spherical aberrations of the objective lens are corrected electrostatic mirror that provides independent control aberration coefficients Cc C3, as well focal length. this II discuss details microscope operation, how is set up in systematic fashion, present typical results.
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