Measuring and correcting aberrations of a cathode objective lens.
作者： R.M. Tromp
DOI: 10.1016/J.ULTRAMIC.2010.11.029
关键词: Cathode 、 Physics 、 Microscopy 、 Apochromat 、 Optics 、 Low-energy electron microscopy 、 Lens (optics) 、 Chromatic scale 、 Chromatic aberration 、 Contrast transfer function
摘要: … order that the objective lens entrance has … objective lens distance, L. Such a uniform field forms a virtual image of the sample, located at a distance −2L from the front of the objective lens…
elsevier.com
sci-hub.se 参考文章(14)
Michael Mauck, Correction of Chromatic Aberration with an Electron Mirror Optik. ,vol. 92, pp. 3- 8 ,(1993) , 10.15760/ETD.1170
Helder Marchetto, High-resolution spectro-microscopic investigations of organic thin film growth Freie Universität Berlin. ,(2006) , 10.17169/REFUBIUM-12249
W. Wan, J. Feng, H.A. Padmore, D.S. Robin, Simulation of a mirror corrector for PEEM3 Nuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment. ,vol. 519, pp. 222- 229 ,(2004) , 10.1016/J.NIMA.2003.11.159
Gertrude F. Rempfer, Denis M. Desloge, Walter P. Skoczylas, O. Hayes Griffith, Simultaneous Correction of Spherical and Chromatic Aberrations with an Electron Mirror: An Electron Optical Achromat Microscopy and Microanalysis. ,vol. 3, pp. 14- 27 ,(1997) , 10.1017/S143192769797001X
Gertrude F. Rempfer, O.Hayes Griffith, The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sources Ultramicroscopy. ,vol. 27, pp. 273- 300 ,(1989) , 10.1016/0304-3991(89)90019-3
R.M. Tromp, J.B. Hannon, A.W. Ellis, W. Wan, A. Berghaus, O. Schaff, A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. Ultramicroscopy. ,vol. 110, pp. 852- 861 ,(2010) , 10.1016/J.ULTRAMIC.2010.03.005
M. Lenc, I. Müllerová, Electron optical properties of a cathode lens Ultramicroscopy. ,vol. 41, pp. 411- 417 ,(1992) , 10.1016/0304-3991(92)90220-E
Gertrude F. Rempfer, A theoretical study of the hyperbolic electron mirror as a correcting element for spherical and chromatic aberration in electron optics Journal of Applied Physics. ,vol. 67, pp. 6027- 6040 ,(1990) , 10.1063/1.345212
Liping Wang, Eric Munro, John Rouse, Haoning Li, Simulation of electron mirrors by the differential algebraic method Physics Procedia. ,vol. 1, pp. 297- 304 ,(2008) , 10.1016/J.PHPRO.2008.07.109
R. Könenkamp, T. Jones, J. Elstner, R. Word, G. Rempfer, T. Dixon, L. Almaraz, W. Skoczylas, Image properties in an aberration-corrected photoemission electron microscope Physics Procedia. ,vol. 1, pp. 505- 511 ,(2008) , 10.1016/J.PHPRO.2008.07.132