作者: Rachid Belkhou , Stefan Stanescu , Sufal Swaraj , Adrien Besson , Milena Ledoux
DOI: 10.1107/S1600577515007778
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摘要: The HERMES beamline (High Efficiency and Resolution dedicated to X-ray Microscopy Electron Spectroscopy), built at Synchrotron SOLEIL (Saint-Auban, France), is soft microscopy. combines two complementary microscopy methods: XPEEM (X-ray Photo Emitted Microscopy) STXM (Scanning Transmission with an aim reach spatial resolution below 20 nm fully exploit the local spectroscopic capabilities of microscopes. availability methods within same enables users select appropriate approach study their specific case in terms sample environment, spectroscopy methods, probing depth etc. In this paper a general description its design are presented. performance specifications will be reviewed detail. Moreover, article aiming demonstrate how performances have been specifically optimized fulfill requirements flux, resolution, beam size Special attention has overcome some limiting hindering problems that usually encountered on beamlines such as carbon contamination, thermal stability spectral purity.