Electron microscope backscattered electron detectors
作者： Vivian N. E. Robinson
DOI:
关键词: Electron beam-induced deposition 、 Environmental scanning electron microscope 、 Electron microscope 、 Conventional transmission electron microscope 、 Optics 、 Scanning transmission electron microscopy 、 Physics 、 Scanning electron microscope 、 Electron 、 Electron tomography
摘要: An electron microscope backscattered detector comprising an arm of scintillation material with a hole through which the beam passes, being provided removable grounded liner to facilitate cleaning and prevent astigmatism problems due build up.
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