Mean Atomic Number Quantitative Assessment in Backscattered Electron Imaging
作者： E. Sánchez , M. Torres Deluigi , G. Castellano
DOI: 10.1017/S1431927612013566
关键词: Thin section 、 Atomic number 、 Reproducibility 、 Computational physics 、 Image map 、 Spectral line 、 Analytical chemistry 、 Monte Carlo method 、 Materials science 、 Exponential function 、 Scanning electron microscope
摘要: A method for obtaining quantitative mean atomic number images in a scanning electron microscope different kinds of samples has been developed. The backscattered signal is monotonically increasing with the Z, and accordingly Z can be given as function image gray levels. From results obtained from Monte Carlo simulations, an exponential fitted to convert registered levels into map. Once this fitting was performed, reproducibility determination checked through acquisition metal mineral standards. developed applied any unknown sample, always controlling experimental conditions, shown here thin section rock which several phases are present; herein compared assessments performed X-ray spectra each phase.
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