作者: Edward Sechkar , Thomas Stueber , Aaron Snyder , Kim de Groh , Sharon Rutledge
DOI:
关键词: Analytical chemistry 、 Low earth orbit 、 Deposition (phase transition) 、 Contamination 、 Oxygen atom 、 Silicone 、 Atomic oxygen 、 Hydrology 、 Chemistry 、 Spacecraft
摘要: The continued presence and use of silicones on spacecraft in low Earth orbit (LEO) has been found to cause the deposition contaminant films surfaces which are also exposed atomic oxygen. composition optical properties resulting SiO(x)- based (where x is near 2) may be dependent upon relative rates arrival oxygen, silicone hydrocarbons. This paper presents results in-space contamination tests, ground laboratory simulation tests analytical modeling identify controlling processes that affect characteristics.