作者: D. Steinmüller-Nethl , R. Kovacs , E. Gornik , P. Rödhammer
DOI: 10.1016/0040-6090(94)90273-9
关键词: Surface plasmon 、 Optics 、 Ellipsometry 、 Work (thermodynamics) 、 Condensed matter physics 、 Excitation 、 Dispersion relation 、 Reflection (mathematics) 、 Tin 、 Titanium nitride 、 Materials science
摘要: Abstract For the first time it is possible to observe excitation of surface plasmons (SP) on thin titanium nitride (TiN) films. From angle- and wavelength-dependent reflection measurements dielectric function TiN, thus optical constants, were calculated. Therefore, main aim this work was determination real imaginary parts e(ω) dispersion relation SP TiN. This method an alternative standard technique ellipsometry for complex function.