Fabrication, patterning and luminescence properties of X2–Y2SiO5:A (A=Eu3+, Tb3+, Ce3+) phosphor films via sol–gel soft lithography
作者： X.M Han , J Lin , J Fu , R.B Xing , M Yu
DOI: 10.1016/J.SOLIDSTATESCIENCES.2004.02.004
关键词: Fourier transform infrared spectroscopy 、 Thin film 、 Phosphor 、 Photoluminescence 、 Analytical chemistry 、 Materials science 、 Scanning electron microscope 、 Soft lithography 、 Luminescence 、 Sol-gel
摘要: X 2 –Y 2 SiO 5 :A (A=Eu 3+ , Tb 3+ , Ce 3+ ) phosphor films and their patterning were fabricated by a sol–gel process combined with a soft lithography. X-ray diffraction (XRD), Fourier …
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