Device for examining samples

作者: Johannes Winterot , Dieter Schau , Dietmar Schmidt

DOI:

关键词: OpticsSample (graphics)Materials scienceTransmitted lightRaySample volumeCcd camera

摘要: The invention relates to a device for examining one or several probes that are arranged in receptacles on sample support by transmitted light incident light, imaging and/or detecting at least part of the volume through container via CCD camera. Downstream said camera an evaluation is provided. vertical illumination performed also receptacle and serves induce emission, preferably it induces fluorescence.

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